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CHARACTERIZATION OF NOVEL HIGH ε DIELECTRIC AND FERROELECTRIC FILMS BY SCANNING PROBE MICROSCOPY (SPM) TECHNIQUES

Author(s):
Landau, S.
Kolbesen, B.O.
Tillman, R.
Bruchhaus, R.
Olbrich, A.
Fritsch, B.
Dehm, C.
Schindler, G.
Hartner, W.
Mazure, C.
5 more
Publication title:
Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
98-1(1)
Pub. Year:
1998
Page(from):
789
Page(to):
797
Pages:
9
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771931 [1566771935]
Language:
English
Call no.:
E23400/98-1
Type:
Conference Proceedings

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