Blank Cover Image

REDUCTION OF GROWN-IN DEFECTS BY HIGH TEMPERATURE ANNEALING

Author(s):
Publication title:
Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
98-1(1)
Pub. date:
1998
Page(from):
698
Page(to):
706
Pages:
9
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771931 [1566771935]
Language:
English
Call no.:
E23400/98-1
Type:
Conference Proceedings

Similar Items:

Hourai, M., Asayama, E., Onno, T., Sano, M., Tsuya, H.

Electrochemical Society

Fujise,T., Yanase,Y., Hourai,M., Sano,M., Tsuya,H.

SPIE-The International Society for Optical Engineering

Hourai, M., Ono, T., Umeno, S., Tanaka, T., Asayaoia, E., Nishikawa, H., Sano, M., Tsuya, H.

Electrochemical Society

8 Conference Proceedings High Quality GaAs on Si Grown by CBE

Uchida,H., Adachi,M., Egawa,T., Nishikawa,H., Jimbo,T., Umeno,M.

Trans Tech Publications

Adachi, N., Nishikawa, H., Komatsu, Y., Hourai, H., Sano, M, Shigematsu, T.

Materials Research Society

S. Ushio, A. Adachi, K. Matsuda, N. Ohtani, T. Kaneko

Trans Tech Publications

Asayama, E., Ono, T., Takeshita, M., Hourai, M., Sano, M., Tsuya, H.

Electrochemical Society

Zakharov, N.D., Werner, P., Gosele, U., Ledentsov, H.H., Bimberg, D., Cherkashin, N.A., Bert, N.A., Volovik, B.V., …

Materials Research Society

Sano, M., Ohgushi, S., Sadamitsu, S., Tsuya, H.

Electrochemical Society

11 Conference Proceedings DEFECT REDUCTION IN MOCVD GROWN Si/GaAs

Al-Jassim, N.M., Nishioka, Takashi, Itoh, Yoshio, Yamamoto, Akio, Yamaguchi, Masafumi

Materials Research Society

Yasushi, A., Sano, N., Kaneko, T.

Trans Tech Publications

Sano, M., Hourai, M., Sumita, S., Shigematsu, T.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12