Blank Cover Image

Electrical Characterization of Plasma Bonded SOI

Author(s):
Publication title:
Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-36
Pub. date:
1997
Page(from):
349
Page(to):
357
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771894 [1566771897]
Language:
English
Call no.:
E23400/97-36
Type:
Conference Proceedings

Similar Items:

C.J. McLachlan, G.V. Rouse, A.L. Rivoli

Electrochemical Society

Farrens, S. N., Roberds, B., Boettcher, M. C., Ismail, M. S., Bowewr, R. W., Desmond, C. A., Hunt, C. E.

Materials Research Society

Easter, W.G, Goodwin, C.A., Hsieh, C.M., Shanaman, R.H., Wallace, S.W., Worrell, M.J.

Electrochemical Society

Liu, J. B., Iyer, S. S. K., Min, J., Chu, P., Gronsky, R., Hu, C., Cheung, N. W.

MRS - Materials Research Society

McCann, P., MeKeever, J., Nicholson, D., Ruddell, F., Gamble, H.S., Nevin, W.A.

Electrochemical Society

Papakonstantinou, P., Somasundram, K., Cao, X., Quinn, C., Yallup, K., Nevin, W.A., Blackstone, S.

Electrochemical Society

Farrens, S., Dekker, J.

Electrochemical Society

Mumola, P.B., Gardopee, G.J., Niaguine, S.

Electrochemical Society

Brierley, C.J., Considine, L., Sethi, R.S., Whatmore, R.W.

Materials Research Society

Vedde, J., Rasmussen, K., Viscor, P., Caraglia, C., Benamara, M.

Electrochemical Society

Farrens, S., Smith, J.

Electrochemical Society

Landen,O.L., Glenzer,S.H., Cauble,R.C., Lee,R.W., Edwards,M.J., DeGroot,J.S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12