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Excess Carrier Lifetime and Surface Recombination Velocity in Dielectrically Isolated SI-Tubs

Author(s):
Meynants, G.
Poortmans, J.
Mertens, R.
Jones, S.
Polce, N.
Blackstone, S.
1 more
Publication title:
Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-36
Pub. Year:
1997
Page(from):
257
Page(to):
263
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771894 [1566771897]
Language:
English
Call no.:
E23400/97-36
Type:
Conference Proceedings

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