Blank Cover Image

ROOM TEMPERATURE PHOTORESIST REMOVAL PROCESS BY USING KF/H2O2/H2O

Author(s):
Publication title:
Proceedings of the Fifth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-35
Pub. Year:
1997
Page(from):
488
Page(to):
495
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771887 [1566771889]
Language:
English
Call no.:
E23400/97-35
Type:
Conference Proceedings

Similar Items:

Kawada,S., Tamai,Y., Omae,S., Ohmi,T.

SPIE - The International Society for Optical Engineering

Ohmi, T., Sugawa, S., Hirayama, M.

Electrochemical Society

Kubo, K., Ojima, S., Toda, M., Ohmi, T.

Electrochemical Society

Kim, J.-S., Morita, H., Joo, J.-D., Ohmi, T.

Electrochemical Society

Ohmi, S., Tung, R. T.

MRS - Materials Research Society

S. Ojima, S. Yano

Society of Photo-optical Instrumentation Engineers

Meuris, M., Izumi, H., Kubo, K., Ojima, S., Ohmi, T., Heyns, M.M.

Electrochemical Society

Iwai, H., Ohmi, S.-I.

Electrochemical Society

Kwada, K., Nakamori, M., Morita, H., Okano, S., Nitta, T., Ohmi, T.

Electrochemical Society

Izumi, H., Nakagawa, Y., Miyoshi, S., Ohmi, T.

Electrochemical Society

Ushiki,T., Hirano,Y., Shimada,H., Ohmi,T.

SPIE-The International Society for Optical Engineering

Yonekawa, N., Yasui, S., Kunimoto, F., Ohmi, T., Kern, F.W.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12