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Structural and Optical Characterization of Polycrystalline Silicon Films Deposited by Single Wafer CVD

Author(s):
Sassela, A.
Borghesi, A.
Amore, G.
Tallarida, G.
Spiga, S.
Cazzaniga, F.
Ferroni, G.
Queirolo, G.
3 more
Publication title:
Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-25
Pub. Year:
1997
Page(from):
1282
Page(to):
1288
Pages:
7
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771788 [1566771781]
Language:
English
Call no.:
E23400/97-25
Type:
Conference Proceedings

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