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Degradation and recovery of alpha ray irradiated MOSFETs on SIMOX

Author(s):
Ohyama, H.
Simoen, E.
Claeys, C.
Takami, Y.
Kawamura, K.
Hakata, T.
Sunaga, H.
Ogita, Y.
3 more
Publication title:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-23
Pub. date:
1997
Page(from):
289
Page(to):
294
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771764 [1566771765]
Language:
English
Call no.:
E23400/97-23
Type:
Conference Proceedings

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