Blank Cover Image

Characterization of MOS-SOI structures by means of capacitance-voltage measurement analysis

Author(s):
Publication title:
Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-23
Pub. date:
1997
Page(from):
197
Page(to):
202
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771764 [1566771765]
Language:
English
Call no.:
E23400/97-23
Type:
Conference Proceedings

Similar Items:

Zareba,A., Ikraiam,F., Beck,R.B., Jakubowski,A.

Narosa Publishing House

Domanski,K., Polrolnik,E., Beck,R.B., Jakubowski,A., Zak,J.K.

Narosa Publishing House

Tomaszewski, D., Lukasiak, L., Gibki, J., Domanski, K., Jakubowski, A., Zareba, A.

SPIE-The International Society for Optical Engineering

Rimmer S. J., Hamilton B., Peaker R. A.

Plenum Press

Sveinbjornsson, E. O., Ahnoff, M., Olafsson, H. O.

Trans Tech Publications

Rim, Kern, Takagi, S., Welser, J. J., Hoyt, J. L., Gibbons, J. F.

MRS - Materials Research Society

4 Conference Proceedings Very Thin (

Beck, R.B., Cuch, M., Wojtkiewicz, A., Kudla, A., Jakubowski, A.

Electrochemical Society

Domanski, K., Tomaszewski, D., Grabiec, P., Gniazdowski, Z., Kudla, A., Beck, R.B., Jakubowski, A., Gotszalk, T., …

SPIE-The International Society for Optical Engineering

Schropp, Ruud E.I., Snijder, Jan, Verwey, Jan F

Materials Research Society

Andrzej Jakubowski, Malgorzata Jurczak, Lukasiak Lidia

Narosa Publishing House

Tomaszewski, D., Domanski, K., Lukasiak, L., Zareba, A., Gibki, J., Jakubowski, A.

Kluwer Academic Publishers

Sonnenberg, V., Martino, J.A.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12