The scanning infra-red microscope: An alternative tool to measure bulk micro-defect density in semiconductors
- Author(s):
Mule'Stagno, L. Bazzali, A. Olmo, M. Toeroek, P. Faister, R. Fraundorf, P. - Publication title:
- Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 97-22
- Pub. Year:
- 1997
- Page(from):
- 431
- Page(to):
- 437
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771757 [1566771757]
- Language:
- English
- Call no.:
- E23400/97-22
- Type:
- Conference Proceedings
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