Metallic impurities and their impact on the formation of internal gettering layer in silicon wafers
- Author(s):
- Jablonski, J.
- Publication title:
- Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 97-22
- Pub. Year:
- 1997
- Page(from):
- 295
- Page(to):
- 308
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771757 [1566771757]
- Language:
- English
- Call no.:
- E23400/97-22
- Type:
- Conference Proceedings
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