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Channel Hot Carrier Stress of Oxynitrided-Gate MOSFETs

Author(s):
Nguyen, K.
Lee, S.
Kahrizi, M.
Landsberger, L.
Belkouch, S.
Jean, C.
1 more
Publication title:
Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-10
Pub. Year:
1997
Page(from):
164
Page(to):
173
Pages:
10
Pub. info.:
Pennington, New Jersey: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771375 [1566771374]
Language:
English
Call no.:
E23400/97-10
Type:
Conference Proceedings

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