Optical and Structural Characterization of Free-Standing Ultrahigh Porosity Silicon Thin Films

Optical and Structural Characterization of Free-Standing Ultrahigh Porosity Silicon Thin Films

Author(s):

Publication title:

Proceedings of the International Symposium on Pits and Pores--Formation, Properties, and Significance for Advanced Luminescent Materials

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

97-7

Pub. Year:

1997

Page(from):

524

Page(to):

532

Pages:

9

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771344 [156677134X]

Language:

English

Call no.:

E23400/97-7

Type:

Conference Proceedings

Details

TDL ID:	ZA00013868
Series ID:	PA00000028
Conf. info. (Name):	International Symposium on Pits and Pores ; Meeting of the Electrochemical Society
Conf. info. (Number):	1997 ; 191st
Conf. info. (Venue):	Montreal, QC, Canada
Conf. info. (Date):	1997.05.04-1997.05.09

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