Blank Cover Image

Current Status of SIMOX Technolgoy - High-Quality ITOX-SIMOX Wafers and their Application to Quarter-Micron CMOS LSIs

Author(s):
Izumi, K.  
Publication title:
ULSI science and technology, 1997 : proceedings of the Sixth International Symposium on Ultralarge Scale Integration Science and Technology
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-3
Pub. Year:
1997
Page(from):
221
Page(to):
234
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771306 [1566771307]
Language:
English
Call no.:
E23400/970512
Type:
Conference Proceedings

Similar Items:

Hotta,S., Onozuka,T., Fukumoto,K., Shirai,S., Okazaki,S.

SPIE-The International Society for Optical Engineering

Bae, K-M., Kim, J-R., Hong, Y-K., So, S-I., Lee, S-C., Kim, S-S., Ha, S-W., Koh, C-G., Pyi, S-H., Lee, D-M.

Electrochemical Society

Takeya, K.

Electrochemical Society

Bae, K-M., Kim, J-R., Hong, Y-K., So, S-I., Lee, S-C., Kim, S-S., Ha, S-W., Koh, C-G., Pyi, S-H., Lee, D-M.

Electrochemical Society

Matsumura, A, Kawamura, K, Mizutani, T, Takaysma, S, Hamaguchi, I, Nagatake, Y

Electrochemical Society

Sallagoity, P., Gaillard, F., Rivoire, M., Paoli, M., Brouquet, P., Haond, M., McClathie, S., Beekmann, K., Kiermasz, …

Electrochemical Society

Tachimori, M, Masui, S, Nakajima, T, Kawamura, K, Hamaguchi, I, Yano, T, Nagatake, Y

Electrochemical Society

Sato,Y., Kosugi,T., shii,H.

SPIE-The International Society for Optical Engineering

Hamada, K., Hamajima, T., Kitano, T., Ohnishi, H., Yoshino, A.

Electrochemical Society

6 Conference Proceedings Current Status of SOFC at Mitsui

Shimotsu, M., Izumi, M., Murata, K.

Electrochemical Society

Yue, J., Liou, H.K., Liu, S.T.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12