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Comparison Between the Cryogenic Behaviour of Deep Submicron Bulk Si and SOI CMOS Devices

Author(s):
Publication title:
Proceedings of the fourth Symposium on Low Temperature Electronics and High Temperature Superconductivity
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-2
Pub. date:
1997
Page(from):
171
Page(to):
186
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771290 [1566771293]
Language:
English
Call no.:
E23400/970511
Type:
Conference Proceedings

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