Blank Cover Image

Influence of D-Defects in FZ Material Used for Power Devices and Their Impact on Lifetime and Leakage Current

Author(s):
Schulze, H.-J.  
Publication title:
Proceedings of the Fourth International Symposium on High Purity Silicon
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-13
Pub. Year:
1996
Page(from):
289
Page(to):
304
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771566 [1566771560]
Language:
English
Call no.:
E23400/963433
Type:
Conference Proceedings

Similar Items:

Schulze, H-J., Kolbesen, B. O.

MRS - Materials Research Society

Niedernostheide, F.-J., Schulze, H.-J., Kellner-Werdehausen, U., Frohnmeyer, A., Wachutka, G.

Electrochemical Society

Schulze,H.-J.

SPIE - The International Society for Optical Engineering

M. Schulze

Electrochemical Society

Schulze, H.-J., Niedemostheide, F.-J., Schmitt, M., Keilner-Werdehausen, U., Wachutka, G.

Electrochemical Society

Wouters J. D., Willems G., Groeseneken G., Maes E. H., Brooks K., Klissurska R.

Kluwer Academic Publishers

F. Hille, F.-J. Niedernostheide, H.-J. Schulze

Electrochemical Society

Dornberger, E., Temmler, D., von Ammon, W.

Electrochemical Society

Schulze,H.-J., Frohnmeyer,A., Niedernostheide,F.-J., Hille,F., Tutto,P., Pavelka,T., Wachutka,G.

Electrochemical Society, SPIE-The International Society for Optical Engineering

J.B. Fonder, P. Brosselard, D. Tournier, M. Berthou, B. Vergne

Trans Tech Publications

Schulze,H.-J., Deboy,G.

SPIE-The International Society for Optical Engineering

Schulze, H.-J., Luedge, A., Riemann, H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12