Blank Cover Image

Application of Microwave Downstream Plasma for Cleaning: Post Via-Etch Residue Removal

Author(s):
Publication title:
Proceedings of the eleventh International Symposium on Plasma Processing
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-12
Pub. Year:
1996
Page(from):
595
Page(to):
605
Pages:
11
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771641 [1566771641]
Language:
English
Call no.:
E23400/962354
Type:
Conference Proceedings

Similar Items:

Naftzger, C.E., Deshmukh, S.

Electrochemical Society

Marks, Steve, Graham, Sandra W., Uk, Tinal, Chang, C.C., Geller, Claudia, Tse, Chiu

Electrochemical Society

Mikulan, P.I., Koo, T.T., Fonash, S.J., Reinhardt, K.A.

Electrochemical Society

Pearton, S.J., Ren, F., Katz, A., Chakrabarti, U.K., Lane, E., Hobson, W.S., Kopf, R.F., Abernathy, C.R., Wu, C.S., …

Materials Research Society

Cheng, C.C., Burke, R, Kennedy, J., Nguyen, D., Wall, R., Lowe, B.

Electrochemical Society

Pavel, E.

Electrochemical Society

Peters, D., Egbe, M., Ravito, R., Rieker, J., Fiener, S., Tea, T., Seong, T.-K., Nguyen, L.V., Henry, S-A., Gaulhofer, …

Electrochemical Society

Timmons, C.L., Hess, D.H.

Electrochemical Society

Zhang, H., Chen, B.H., Ye, J.H., Chooi, S.Y.M., Cha, R., Cha, L.

Electrochemical Society

S. Bilouk, C. Pernel, R.P. Nogueira, L. Broussous, P. Haumesser

Electrochemical Society

Chang, C.K., Tsang, C.F., Nguyen, V., Zhang, Q., Foo, T.H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12