Spatially and Energy-Resolved Hot-Electron Transport Through Metal-Oxide-Silicon Structures
- Author(s):
- Publication title:
- The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 96-1
- Pub. Year:
- 1996
- Page(from):
- 580
- Page(to):
- 591
- Pages:
- 12
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771511 [156677151X]
- Language:
- English
- Call no.:
- E23400/962115
- Type:
- Conference Proceedings
Similar Items:
MRS - Materials Research Society |
7
Conference Proceedings
Electron Scattering and Dielectric Breakdown in Liquid and Solid Dielectrics
Plenum Press |
Plenum Press |
SPIE - The International Society for Optical Engineering |
3
Conference Proceedings
QUANTITATIVE ELECTRONIC STRUCTURE ANALYSIS OF α-Al2O3 USING SPATIALLY RESOLVED VALENCE ELECTRON ENERGY-LOSS SPECTRA
MRS - Materials Research Society |
Plenum Press |
4
Conference Proceedings
Local Electronic Structure of Defects in GaN From Spatially Resolved Electron Energy-Loss Spectroscopy
MRS - Materials Research Society |
Materials Research Society |
SPIE - The International Society of Optical Engineering |
Materials Research Society |
Plenum Press |
12
Conference Proceedings
Efficient Solar Cell Structure Prepared by Electrodeposition into Oscillation-Induced Nanoporous Silicon Oxide
Electrochemical Society |