Blank Cover Image

Chemical Structure Changes Observed During Si-SiO2 Interface Formation

Author(s):
Hattori, T.  
Publication title:
The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-1
Pub. Year:
1996
Page(from):
392
Page(to):
405
Pages:
14
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771511 [156677151X]
Language:
English
Call no.:
E23400/962115
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings INITIAL STAGE OF SiO2/Si INTERFACE FORMATION ON HYDROGEN-TERMINATED SILICON SURFACES

Hattori, T., Nohira, H., Ohishi, K., Shimizu, Y., Tamura, Y.

MRS - Materials Research Society
7 Conference Proceedings *CHEMICAL STRUCTURES OF NATIVE OXIDES FORMED DURING WET CHEMICAL TREATMENTS ON NH4F TREATED Si(111) SURFACES

Hattori, Takeo, Ogawa, Hiroki

Materials Research Society
2 Conference Proceedings Chemical Structures of Oxynitride/Si(100) Interface

Takahashi, K., Nohira, H., Kato, H., Tamura, N., Hikazutani, K., Sano, S., Hattori, T.

Electrochemical Society
8 Conference Proceedings Structure of the Si-SiO2 interface

Plucinski,K.J.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Valence-Band Discontinuity at and Near the SiO2/Si(111) Interface

Nohira, Hiroshi, Hattori, Takeo

MRS - Materials Research Society
9 Conference Proceedings Oxidation of Si(OO1) Surface and Formation of Si/SiO2 Interface

Uchiyarna, T., Uda, T., Terakura, K.

Electrochemical Society
4 Conference Proceedings Morphological Change in Surface and Interface during Ultrathin SiO₂ Film Growth

R. Hasunuma, J. Okamoto, N. Tokuda, K. Yamabe

Electrochemical Society
10 Conference Proceedings Effect of Deposition Temperature on Chemical Structure of Lanthanum Oxide/Si Interface Structure

H. Nohira, T. Matsuda, K. Tachi, Y. Shiino, J. Song, Y. Kuroki, J. Ng, P. Ahmet, K. Kakushima, K. Tsutsui, E. Ikenaga, …

Electrochemical Society
5 Conference Proceedings SURFACE CLEANING PRIOR TO FORMATION OF Si/SiO2 INTERFACES BY REMOTE PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION (RPECVD)

Lamb, H.H., Kalem, S., Bedge, S., Yasuda, T., Ma, Y., Lucovsky, G.

Materials Research Society
11 Conference Proceedings Atomic Dynamics During Silicon Oxidation and the Nature of Defects at the Si-SiO2 Interface

Pantelides, S. T., Ramamoorthy, M.

MRS - Materials Research Society
6 Conference Proceedings Electronic Structures of SiO2/Si(O01) Interfaces

Yamasaki, T., Kaneta, C., Uchiyama, T., Uda, T., Terakura, K.

Electrochemical Society
12 Conference Proceedings Si Wire Light Emission Changes During Si/SiOx Interface Formation

Becenil-Espinoza, F.G., Torchynska, T.V., Rodriguez, M.Morales, Khomenkova, L., Scherbina, L.V.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12