Blank Cover Image

A Review of Electron Spin Resonance Spectroscopy of Defects in Thin Film SiO2 on Silicon

Author(s):
Publication title:
The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-1
Pub. date:
1996
Page(from):
214
Page(to):
249
Pages:
36
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771511 [156677151X]
Language:
English
Call no.:
E23400/962115
Type:
Conference Proceedings

Similar Items:

Conley, John F., Jr., Lenahan, P. M.

MRS - Materials Research Society

Brian J. Simonds, Feng Zhu, Josh Gallon, Jian Hu, Arun Madan, Craig Taylor

Materials Research Society

Schwartz, Robert N., Clark, Marlon D., Chalitrat, Walee, Kevan, larry

Materials Research Society

Nishikawa, H., Fukui, H., Watanabe, E., Ito, D., Seol, K.S., Ishii, K., Ohki, Y., Takiyama, M., Tachimori, M.

Electrochemical Society

Lenahan, P.M., Kang, A.Y., Campbell, J.P.

SPIE-The International Society for Optical Engineering

Nishikawa,H., Fukui,H., Watanabe,E., Ito,D., Takiyama,M., Ieki,A., Ohki,Y.

Trans Tech Publications

Daineka, D., Bulkin, P., Girard, G., Bouree, J.-E.

Trans Tech Publications

B. Langdon, D. Patel, E. Krous, P. Langston, C. S. Menoni

Society of Photo-optical Instrumentation Engineers

Xiong-Skiba, P., Carroll, D.L., Doering, D.L., Siek, K.H.

Materials Research Society

Malten, C., Finger, F., Hapke, P., Kulessa, T., Walker, C., Carius, R., Fluckiger, R., Wagner, H.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12