Blank Cover Image

Temperature Dependence of Gate-Induced-Drain-Leakage (GIDL) Current in Thin-Film SOl MOSFETs

Author(s):
Publication title:
Proceedings of the Symposium on Low Temperature Electronics and High Temperature Superconductivity
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
95-9
Pub. date:
1995
Page(from):
260
Page(to):
270
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771030 [156677103X]
Language:
English
Call no.:
E23400/952069
Type:
Conference Proceedings

Similar Items:

Jomaah, J, Ghibaudo, G, Pelloie, J L, Balestra, F

Electrochemical Society

A. Emrani, G. Ghibaudo, F. Balestra

Electrochemical Society

J. Jomaah, F. Balestra, G. Ghibaudo

Electrochemical Society

Zhao, X, Ioannou, D, Jenkins, W, Hughes, H, Liu, S T

Electrochemical Society

Jomaah, J., Balestra, F., Ghibaudo, G.

Electrochemical Society

Dimitrakis, P., Jomaah, J., Balestra, F., Papaioannou, G.J.

Kluwer Academic Publishers

Jomaah, J, Ghibaudo, G, Balestra, F

Electrochemical Society

Dimitrakis, P., Balestra, J. Jomaah. F., Papajoannon, G.J.

Electrochemical Society

Dauge, F., Jomaah, J., Ghibaudo, G.

Electrochemical Society

L. Zafari, J. Jomaah, G. Ghibaudo, O. Faynot, A. Vandooren

Electrochemical Society

J. Jomaah, G. Ghibaudo, S. Cristoloveanu, A. Vandooren, F. Dieudonné, J. Pretet, F. Lime, K. Oshima, B. Guillaumot, F. …

Electrochemical Society

K. Rais, A. Emrani, F. Balestra, G. Ghibaudo

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12