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Recent Advances in Fully-Scanned Active Matrix Displays Using Silicon-on-Insulator Technology

Author(s):
Dolny, G.
Ipri, A.C.
Hsueh, F-L.
Stewart, R.G.
Atherton, J.
Cuomo, F.
Jose, D.
Spitzer, M.
Batty, D-P. VuM.
Khormaei, R.
Keyser, T.
Becker, G.
Tilton, M.
Rhoades, R.
Ellis, R.
Franklin, H.
Helgeson, M.
12 more
Publication title:
Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
95-7
Pub. date:
1995
Page(from):
426
Page(to):
433
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771016 [1566771013]
Language:
English
Call no.:
E23400/952067
Type:
Conference Proceedings

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