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Measurement of generation lifetime in partially depleted SOI MOSFETs

Author(s):
Shin, H C
Racanelli, M
Huang, W M
Ford, J
Foersiner, J
Shin, H
Wetteroth, T
Hong, S Q
Wilson, S R
Schroder, D K
Cheng, S
6 more
Publication title:
Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-3
Pub. Year:
1995
Page(from):
263
Page(to):
270
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771535 [1566771536]
Language:
English
Call no.:
E23400/962142
Type:
Conference Proceedings

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