Blank Cover Image

Generation-recombination noise sources in SOI MOSFETs

Author(s):
Publication title:
Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-3
Pub. Year:
1995
Page(from):
255
Page(to):
262
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771535 [1566771536]
Language:
English
Call no.:
E23400/962142
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Noise and Tunneling Through the 2.5 nm Gate Oxide in SOI MOSFETs

Lukyanchikova, N., Simoen, E., Mercha, A., Claeys, C.

Kluwer Academic Publishers
7 Conference Proceedings The Kink-Related Excess Noise in SOI and Bulk nMOSTs at Cryogenic Temperatures

E. Simoen, B. Dierickx, C. Claeys

Electrochemical Society
2 Conference Proceedings Interface defects of the new type detected by the noise method in SOI and SOS MOSFETs

Lukyanchikova, N., Petrichuk, M., Garbar, N., Simoen, E., Claeys, C.

Electrochemical Society
8 Conference Proceedings Radiation characteristics of short p-channel MOSFETs on SOI substrates

Evtukh, A., Kizjak, A., Litovchenko, V., Claeys, C., Simoen, E.

Kluwer Academic Publishers
3 Conference Proceedings Back-gate induced noise overshoot in partially-depleted SOI MOSFETs

Lukyanchikova, N., Garbar, N., Smolanka, A., Simoen, E., Claeys, C.

Kluwer Academic Publishers
9 Conference Proceedings OPTIMISED DIODE ASSESSMENT OF THE SURFACE AND BULK GENERATION/RECOMBINATION PROPERTIES OF SILICON SUBSTRATE

Simoen, E., Poyai, A., Claeys, C., Czerwinski, A., Katcki, J.

Electrochemical Society
4 Conference Proceedings Substrate Current Characteristics of Partially Depleted SOI n-MOSFETs from Room Temperature down to Liquid Helium Temperatures

Simoen, E., Claeys, C.

Electrochemical Society
10 Conference Proceedings Evaluation of the Channel Engineering Impact on the Analog Performance of Deep-Submicrometer Partially Depleted SOI MOSFETs at Low Temperatures

Pavanello, M. A., Martino, J. A., Simoen, E., Claeys, C.

Electrochemical Society
5 Conference Proceedings Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

Simoen, E., Mercha, A., Claeys, C.

Kluwer Academic Publishers
11 Conference Proceedings Influence of the Back Gate Voltage on the Total Series Resistance of Fully Depleted SOI MOSFETS at 300 K and 77 K

Nicolett, A.S., Martino, J.A., Simoen, E., Claeys, C.

Electrochemical Society
6 Conference Proceedings Theoretical and Experimental Study of the Front and Back Interface Trap Density in Accumulation-Mode SOI MOSFETs

Martino, J.A., Simoen, E., Claeys, C.

Electrochemical Society
12 Conference Proceedings Improved Model to Determine the Generation Lifetime in Short Channel SOI nMOSFETs

M. Galeti, J. A. Martino, E. Simoen, C. Claeys

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12