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Nano-Scale Imaging of Compositional Defect and Dopant Distributions in Semiconductor Laser Heterostructures

Author(s):
Hull, R.
Moore, M.
Bahnck, D.
Geva, M.
Karlicek, R.F., Jr.
Stevie, F.A.
Walker, J.F.
2 more
Publication title:
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
95-6
Pub. Year:
1995
Page(from):
23
Page(to):
38
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771009 [1566771005]
Language:
English
Call no.:
E23400/952066
Type:
Conference Proceedings

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