Xray Diffraction Imaging of ZnSe

Author(s):

• Black, D.
• Burdette, H.

Publication title:

Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII)

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

95-6

Pub. Year:

1995

Page(from):

13

Page(to):

22

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771009 [1566771005]

Language:

English

Call no.:

E23400/952066

Type:

Conference Proceedings