SHALLOW ANGLE X-RAY DIFFRACTION FROM IN -SITU DIAMOND THIN FILMS

SHALLOW ANGLE X-RAY DIFFRACTION FROM IN -SITU DIAMOND THIN FILMS

Author(s):

Publication title:

Proceedings of the Fourth International Symposium on Diamond Materials

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

95-4

Pub. Year:

1995

Page(from):

473

Page(to):

478

Pages:

6

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566770989 [156677098X]

Language:

English

Call no.:

E23400/952064

Type:

Conference Proceedings

Details

TDL ID:	ZA00013810
Series ID:	PA00000028
Conf. info. (Name):	International Symposium on Diamond Materials ; Meeting of the Electrochemical Society
Conf. info. (Number):	4th ; 187th
Conf. info. (Venue):	Reno, Nevada, USA
Conf. info. (Date):	1995.05.11-1995.05.26

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