Comparison of three inverse Fourier transform techniques to determine the second-order optical nonlinearity profile of thin films
- Author(s):
- Ozcan, A. ( Stanford Univ. (USA) )
- Digonnet, M.J.F. ( Stanford Univ. (USA) )
- Kino, G.S. ( Stanford Univ. (USA) )
- Publication title:
- Integrated Optics and Photonic Integrated Circuits
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5451
- Pub. Year:
- 2004
- Page(from):
- 304
- Page(to):
- 310
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453747 [0819453749]
- Language:
- English
- Call no.:
- P63600/5451
- Type:
- Conference Proceedings
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