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Comparison of three inverse Fourier transform techniques to determine the second-order optical nonlinearity profile of thin films

Author(s):
Publication title:
Integrated Optics and Photonic Integrated Circuits
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5451
Pub. date:
2004
Page(from):
304
Page(to):
310
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453747 [0819453749]
Language:
English
Call no.:
P63600/5451
Type:
Conference Proceedings

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