Spectroscopic characterization of explosives in the far-infrared region
- Author(s):
Chen, Y. ( Rensselaer Polytechnic Institute (USA) ) Liu, H. ( Rensselaer Polytechnic Institute (USA) ) Deng, Y. ( Rensselaer Polytechnic Institute (USA) ) Veksler, D.B. ( Rensselaer Polytechnic Institute (USA) ) Shur, M.S. ( Rensselaer Polytechnic Institute (USA) ) Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) ) Schauki, D. ( Johns Hopkins Univ. (USA) ) Fitch, M.J. ( Johns Hopkins Univ. (USA) ) Osiander, R. ( Johns Hopkins Univ. (USA) ) Dodson, C. ( Johns Hopkins Univ. (USA) ) Spicer, J.B. ( Johns Hopkins Univ. (USA) ) - Publication title:
- Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5411
- Pub. Year:
- 2004
- Page(from):
- 1
- Page(to):
- 8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453341 [081945334X]
- Language:
- English
- Call no.:
- P63600/5411
- Type:
- Conference Proceedings
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