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Spectroscopic characterization of explosives in the far-infrared region

Author(s):
Chen, Y. ( Rensselaer Polytechnic Institute (USA) )
Liu, H. ( Rensselaer Polytechnic Institute (USA) )
Deng, Y. ( Rensselaer Polytechnic Institute (USA) )
Veksler, D.B. ( Rensselaer Polytechnic Institute (USA) )
Shur, M.S. ( Rensselaer Polytechnic Institute (USA) )
Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) )
Schauki, D. ( Johns Hopkins Univ. (USA) )
Fitch, M.J. ( Johns Hopkins Univ. (USA) )
Osiander, R. ( Johns Hopkins Univ. (USA) )
Dodson, C. ( Johns Hopkins Univ. (USA) )
Spicer, J.B. ( Johns Hopkins Univ. (USA) )
6 more
Publication title:
Terahertz for military and security applications II : 12-13 April 2004, Orlando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5411
Pub. Year:
2004
Page(from):
1
Page(to):
8
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453341 [081945334X]
Language:
English
Call no.:
P63600/5411
Type:
Conference Proceedings

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