Blind characterization of materials using single-sided thermography

Blind characterization of materials using single-sided thermography

Author(s):

Shepard, S.M. ( Thermal Wave Imaging, Inc. (USA) )
Lhota, J.R. ( Thermal Wave Imaging, Inc. (USA) )
Hou, Y.L. ( Thermal Wave Imaging, Inc. (USA) )
Ahmed, T. ( Thermal Wave Imaging, Inc. (USA) )

Publication title:

Thermosense XXVI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5405

Pub. Year:

2004

Page(from):

442

Page(to):

446

Pages:

5

Pub. info.:

Bellingham, Wash: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453280 [0819453285]

Language:

English

Call no.:

P63600/5405

Type:

Conference Proceedings

Details

TDL ID:	ZA00013758
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Thermosense
Conf. info. (Number):	2004 : 26th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2004.04.13-2004.04.15

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