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Gamma radiation tolerance of 0.5-μm SOI MOSFETs

Author(s):
Publication title:
Micro- and Nanoelectronics 2003
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5401
Pub. date:
2004
Page(from):
332
Page(to):
336
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453242 [0819453242]
Language:
English
Call no.:
P63600/5401
Type:
Conference Proceedings

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