Blank Cover Image

Novel event identification for SHM systems using unsupervised neural computation

Author(s):
Publication title:
Nondestructive evaluation and health monitoring of aerospace materials and composites III : 16-17 March 2004, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5393
Pub. Year:
2004
Page(from):
168
Page(to):
177
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453105 [0819453102]
Language:
English
Call no.:
P63600/5393
Type:
Conference Proceedings

Similar Items:

Card, L., McNeill, D. K.

SPIE - The International Society of Optical Engineering

Vyas, N.S., Padhy, D.K.

SPIE-The International Society for Optical Engineering

McNeill, D. K., Card, L.

SPIE - The International Society of Optical Engineering

Carder K. L., English D. C., Du C.

SPIE - The International Society of Optical Engineering

N. J. Dhruve, D. K. McNeill

SPIE - The International Society of Optical Engineering

Srinivasan, A., Subramani, M.K., Pandya, A.S.

SPIE-The International Society for Optical Engineering

D.K. Le

Society of Photo-optical Instrumentation Engineers

Pratt,P.D., Carder,K.L., Costello,D.K., Lee,Z.

SPIE-The International Society for Optical Engineering

Hou,W., Carder,K.L., Costello,D.K.

SPIE-The International Society for Optical Engineering

Finfrock, D.K.

SPIE-The International Society for Optical Engineering

Wang,C., Yen,L.-K., Principe,J.C.

SPIE-The International Society for Optical Engineering

Ridgway H.S., Carder A.D., Green F.R., Gaunt S.A., Gaunt L.S.L., Evans E.W.

PLENNUM PRESS

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12