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High-resolution nondestructive evaluation at the Center for Materials Diagnosis

Author(s):
Meyendorf, N. ( Univ. of Dayton Research Institute (USA) )
Sathish, S. ( Univ. of Dayton Research Institute (USA) )
Druffner, C.J. ( Univ. of Dayton Research Institute (USA) )
Blackshire, J.L. ( Univ. of Dayton Research Institute (USA) and Univ. of Dayton (USA) )
Hoffmann, J.P. ( Univ. of Dayton Research Institute (USA) and S&K Technologies Inc. (USA) )
Zhan, Q. ( Univ. of Dayton Research Institute (USA) )
Andrews, R.J. ( Univ. of Dayton Research Institute (USA) )
2 more
Publication title:
Testing, Reliability, and Application of Micro-and Nano-Material Systems II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5392
Pub. date:
2004
Page(from):
256
Page(to):
265
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453099 [0819453099]
Language:
English
Call no.:
P63600/5392
Type:
Conference Proceedings

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