Mix-and-match overlay method by compensating dynamic scan distortion error
- Author(s):
- Kono, T. ( Toshiba Corp. (Japan) )
- Takakuwa, M. ( Toshiba Corp. (Japan) )
- Asanuma, K. ( Toshiba Corp. (Japan) )
- Komine, N. ( Toshiba Corp. (Japan) )
- Higashiki, T. ( Toshiba Corp. (Japan) )
- Publication title:
- Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5378
- Pub. Year:
- 2004
- Page(from):
- 221
- Page(to):
- 227
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452917 [0819452912]
- Language:
- English
- Call no.:
- P63600/5378
- Type:
- Conference Proceedings
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