Effect of reduction ratio on polarization impact for imaging

Effect of reduction ratio on polarization impact for imaging

Author(s):

Gordon, R.L. ( IBM Microelectronics Div. (USA) )
Brunner, T.A. ( IBM Microelectronics Div. (USA) )
Seong, N. ( IBM Microelectronics Div. (USA) )
Lercel, M.J. ( IBM Microelectronics Div. (USA) )
Gallatin, G.M. ( IBM Microelectronics Div. (USA) )

Publication title:

Optical Microlithography XVII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5377

Pub. Year:

2004

Page(from):

1499

Page(to):

1509

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452900 [0819452904]

Language:

English

Call no.:

P63600/5377.3

Type:

Conference Proceedings

Details

TDL ID:	ZA00013729
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Optical Microlithography
Conf. info. (Number):	2004 : 17th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2004.02.24-2004.02.27

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