Quantification of CD-SEM wafer global charging effect on CD and CD uniformity of 193-nm lithography
- Author(s):
Ke, C.-M. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Hung, H.-L. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Chang, A. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Chen, J.-H. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Gau, T.-S. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Ku, Y.-C. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Lin, B.J. ( Taiwan Semiconductor Manufacturing Co., Ltd. (Taiwan) ) Otaka, T. ( Hitachi High-Technologies Corp. (Japan) ) Ueda, K. ( Hitachi High-Technologies Corp. (Japan) ) Kawada, H. ( Hitachi High-Technologies Corp. (Japan) ) Nomura, H. ( Hitachi High-Technologies Corp. (Japan) ) Ren, N. ( Hitachi High-Technologies Corp. (Japan) ) - Publication title:
- Metrology, Inspection, and Process Control for Microlithography XVIII
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5375
- Pub. Year:
- 2004
- Page(from):
- 173
- Page(to):
- 182
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452887 [0819452882]
- Language:
- English
- Call no.:
- P63600/5375.1
- Type:
- Conference Proceedings
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