Blank Cover Image

Status of Philips' extreme UV source

Author(s):
Pankert, J. ( Philips Extreme UV GmbH (Germany) )
Bergmann, K. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Klein, J. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Neff, W. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Rosier, O. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Seiwert, S. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Smith, C. ( Fraunhofer-Institut fuer Lasertecknik (Germany) )
Probst, S. ( Fraunhofer-Institut fuer Lasertechnik (Germany) )
Vaudrevange, D. ( Philips Extreme UV GmbH (Germany) )
Siemons, G. ( Philips Extreme UV GmbH (Germany) )
Apetz, R. ( Philips Extreme UV GmbH (Germany) )
Jonkers, J. ( Philips Extreme UV GmbH (Germany) )
Loeken, M. ( Philips Extreme UV GmbH (Germany) )
Derra, G. ( Philips Research Labs. (Germany) )
Kruecken, T. ( Philips Research Labs. (Germany) )
Zink, P. ( Philips Research Labs. (Germany) )
11 more
Publication title:
Emerging Lithographic Technologies VIII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5374
Pub. Year:
2004
Page(from):
152
Page(to):
159
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452870 [0819452874]
Language:
English
Call no.:
P63600/5374.1
Type:
Conference Proceedings

Similar Items:

Pankert, J., Bergmann, K., Klein, J., Neff, W., Rosier, O., Seiwert, S., Smith, C., Probst, S., Vaudrevange, D., …

SPIE-The International Society for Optical Engineering

Lebert, R., Jagle, B., Wies, C., Stamm, U., Kleinschmidt, J., Gaebel, K., Schriever, G., Pankert, J., Bergmann, K., …

SPIE - The International Society of Optical Engineering

Pankert, J., Apetz, R., Bergmann, K., Damen, M., Derra, G., Franken, O., Jassen, M., Jonkers, J., Klein, J., Kraus, H., …

SPIE - The International Society of Optical Engineering

Lebert,R., Bergmann,K., Juschkin,L., Rosier,O., Neff,W.

SPIE-The International Society for Optical Engineering

Pankert, J., Bergmann, K., Klein, J., Neff, W., Rosier, O., Seiwert, S., Smith, C., Apetz, R., Jonkers, J., Loeken, M., …

SPIE-The International Society for Optical Engineering

Lebert, R., Wies, C., Jaegle, B., Juschkin, L., Bieberle, U., Meisen, M., Neff, W., Bergmann, K., Walter, K., Rosier, …

SPIE - The International Society of Optical Engineering

V. Bakshi, R. Lebert, B. Jaegle, C. Wies, U. Stamm, J. Kleinschmidt, G. Schriever, C. Ziener, M. Corthout, J. Pankert, …

SPIE - The International Society of Optical Engineering

10 Conference Proceedings Collection efficiency of EUV sources

Derra, G.H., Singer, W.

SPIE-The International Society for Optical Engineering

M. Corthout, R. Apetz, J. Brudermann, M. Darnen, G. Derra

Society of Photo-optical Instrumentation Engineers

Schriever,G., Rahe,M., Neff,W., Bergmann,K., Lebert,R., Lauth,H., Basting,D.

SPIE - The International Society for Optical Engineering

Dusterer,S., Rahe,M., Rebhan,U., Basting,D., Walecki,W.J., Lauth,H., Lebert,R., Bergmann,K., Hoffmann,D., Rosier,O., …

SPIE-The International Society for Optical Engineering

Constantinescu,R.C., Jonkers,J., Hegeman,P., Visser,M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12