Classification of melanoma using wavelet-transform-based optimal feature set

Classification of melanoma using wavelet-transform-based optimal feature set

Author(s):

Walvick, R.P. ( New Jersey Institute of Technology (USA) )
Patel, K. ( New Jersey Institute of Technology (USA) )
Patwardhan, S.V. ( New Jersey Institute of Technology (USA) )
Dhawan, A.P. ( New Jersey Institute of Technology (USA) )

Publication title:

Medical Imaging 2004: Image Processing

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5370

Pub. Year:

2004

Page(from):

944

Page(to):

951

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819452832 [0819452831]

Language:

English

Call no.:

P63600/5370.2

Type:

Conference Proceedings

Details

TDL ID:	ZA00013716
Series ID:	PA00000029
Conf. info. (Name):	Medical imaging
Conf. info. (Number):	2004
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2004.02.16-2004.02.19

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