Fabrication of an electrochemical tip-probe system embedded in SiNx cantilevers for simultaneous SECM and AFM analysis
- Author(s):
- Fasching, R.J. ( Stanford Univ. (USA) )
- Tao, Y. ( Stanford Univ. (USA) )
- Prinz, F.B. ( Stanford Univ. (USA) )
- Publication title:
- Micromachining and Microfabrication Process Technology IX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5342
- Pub. Year:
- 2004
- Page(from):
- 53
- Page(to):
- 64
- Pages:
- 12
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452504 [0819452505]
- Language:
- English
- Call no.:
- P63600/5342
- Type:
- Conference Proceedings
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