Fabrication of an electrochemical tip-probe system embedded in SiNx cantilevers for simultaneous SECM and AFM analysis

Fabrication of an electrochemical tip-probe system embedded in SiNx cantilevers for simultaneous SECM and AFM analysis

Author(s):

Fasching, R.J. ( Stanford Univ. (USA) )
Tao, Y. ( Stanford Univ. (USA) )
Prinz, F.B. ( Stanford Univ. (USA) )

Publication title:

Micromachining and Microfabrication Process Technology IX

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5342

Pub. Year:

2004

Page(from):

53

Page(to):

64

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452504 [0819452505]

Language:

English

Call no.:

P63600/5342

Type:

Conference Proceedings

Details

TDL ID:	ZA00013686
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components : Micromachining and Microfabrication Process Technology
Conf. info. (Number):	2004 : 9th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2004.01.27-2004.01.29

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