532-nm laser sources based on intracavity frequency doubling of extended-cavity surface-emitting diode lasers

532-nm laser sources based on intracavity frequency doubling of extended-cavity surface-emitting diode lasers

Author(s):

Shchegrov, A.V. ( Novalux, Inc. (USA) )

Umbrasas, A. ( Novalux, Inc. (USA) )

Watson, J.P. ( Novalux, Inc. (USA) )

Lee, D. ( Novalux, Inc. (USA) )

Amsden, C.A. ( Novalux, Inc. (USA) )

Ha, W. ( Novalux, Inc. (USA) )

Carey, G.P. ( Novalux, Inc. (USA) )

Doan, V.V. ( Novalux, Inc. (USA) )

Moran, B. ( Novalux, Inc. (USA) )

Lewis, A. ( Novalux, Inc. (USA) )

Mooradian, A. ( Novalux, Inc. (USA) )

6 more

Publication title:

Solid state lasers XIII : technology and devices : 27-29 January 2004, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5332

Pub. Year:

2004

Page(from):

151

Page(to):

156

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452405 [0819452408]

Language:

English

Call no.:

P63600/5332

Type:

Conference Proceedings

Details

TDL ID:	ZA00013676
Series ID:	PA00000029
Conf. info. (Name):	SPIE LASE : Solid State Lasers
Conf. info. (Number):	2004 : 13th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2004.01.27-2004.01.29

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