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Noninvasive monitoring of the thermal stress in RPE using light scattering spectroscopy

Author(s):
Schule, G. ( Stanford Univ. (USA) )
Huie, P. ( Stanford Univ. (USA) )
Vankov, A.B. ( Stanford Univ. (USA) )
Vitkin, E. ( Beth Israel Deaconess Medical Ctr., Harvard Univ. (USA) )
Fang, H. ( Beth Israel Deaconess Medical Ctr., Harvard Univ. (USA) )
Hanlon, E.B. ( Beth Israel Deaconess Medical Ctr., Harvard Univ. (USA) )
Perelman, L.T. ( Beth Israel Deaconess Medical Ctr., Harvard Univ. (USA) )
Palanker, D.V. ( Stanford Univ. (USA) )
3 more
Publication title:
Ophthalmic Technologies XIV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5314
Pub. Year:
2004
Page(from):
95
Page(to):
99
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452221 [081945222X]
Language:
English
Call no.:
P63600/5314
Type:
Conference Proceedings

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