Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors

Contrast sensitivity methods for acceptable limits of visual defects in CMOS sensors

Author(s):

Yanof, A.W. ( Motorola (USA) )
Jachimowicz, K.E. ( Motorola (USA) )

Publication title:

Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5301

Pub. Year:

2004

Page(from):

393

Page(to):

401

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452047 [0819452041]

Language:

English

Call no.:

P63600/5301

Type:

Conference Proceedings

Details

TDL ID:	ZA00013645
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Sensors and camera systems for scientific, industrial, and digital photography applications
Conf. info. (Number):	2004 : 5th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2004.01.19-2004.01.21

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