Blank Cover Image

Digital TV image quality improvement considering distributions of edge characteristic

Author(s):
  • Hong, S.-G. ( Electronics and Telecommunications Research Institute (South Korea) )
  • Kim, J.-C. ( Electronics and Telecommunications Research Institute (South Korea) )
  • Park, J.-H. ( Electronics and Telecommunications Research Institute (South Korea) )
Publication title:
Image Quality and System Performance
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5294
Pub. Year:
2004
Page(from):
239
Page(to):
246
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451972 [0819451975]
Language:
English
Call no.:
P63600/5294
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Optimization of ABS considering the static and dynamic characteristics for OFH [5966-72]

Park, K. -S., Kim, J., Park, N. -C., Lee, J. S., Choi, D. -H., Park, Y. --P.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Improvement of Electrical Characteristics in SPC-Si TFT Employing H2 Plasma Treatment

S. Park, S. Kim, J. Lee, C. Kim, M. Han

Electrochemical Society
2 Conference Proceedings A scalable SIMD digital signal processor for high-quality multifunctional printer systems

Kang, H. -J., Choi, Y., Kim, K., Park, I. -C., Kim, J. -W., Lee, E. -H., Gahang, G. -S.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Vibration characteristics and birefringence of optical disk considering initial stress

Park,S.J., Kim,S.K., Lee,C.Y.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Quality improvement through an efficient image segmentation

J.-S. Park, J.-H. Jeon

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Improvement of shot uniformity on a wafer by controlling backside transmittance distribution of a photomask

Park, J.R., Kim, S.H., Yeo, G.-S., Choi, S.-W., Ki, W.-T., Yoon, H.-S., Sohn, J.-M.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Edge-and-corner-directed interpolation

Kim, H., Park, C. -J., Kim, S. -E., Lee, I. -H.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Advanced thermal imaging system for tank sights

Hong, S. M., Kim, H. S., Yu, W. K., Lee, G. H., Yoon, E. S., Park, Y. C., Choi, S. C., Lee, J. H.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Improvement of line edge roughness by employing new PAG

Kim, Y.-S., Kim, Y.-H., Lee, S.-H., Yim, Y.-G., Kim, D,-B., Kim, J.-H.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Improved characteristics of rainbow defects with novel wafer edge exposure technique

Shim, K.-C., Kim, M.-S., Lee, E.-S., Lee, C.-S., Gil, M.-G., Kim, B.-H., In, J.-S., Yoon, T.-B., Kim, J.-S.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Improvement in Thermal Stability of MOCVD HfO₂ Films Using an ALD SiNx Interfacial Layer

H. J. Jang, S. H. Hong, T. Park, J. Heo, S. Yang, M. Kim, C. Hwang

Electrochemical Society
12 Conference Proceedings Impact monitoring in smart composites using stabilization-controlled FBG sensor system

Bang, H.-J., Park, S.-W., Kim, D.-H., Hong, C.-S., Kim, C.-G.

SPIE - The International Society of Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12