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Toward measuring concentration gradients in polymer-dispersed liquid crystals with secondary ion mass spectrometry

Author(s):
Kjellander, B.K.C. ( Dutch Polymer Institute (Netherlands) and Technische Univ. Eindhoven (Netherlands) )
Van IJzendoorn, L.J. ( Technische Univ. Eindhoven (Netherlands) )
de Jong, A.M. ( Technische Univ. Eindhoven (Netherlands) )
Broer, D.J. ( Technische Univ. Eindhoven (Netherlands) )
van Gennip, W.J.H. ( Technische Univ. Eindhoven (Netherlands) )
de Voigt, M.J.A. ( Technische Univ. Eindhoven (Netherlands) )
Niemantsverdriet, H.J.W. ( Technische Univ. Eindhoven (Netherlands) )
2 more
Publication title:
Liquid Crystal Materials, Devices, and Applications X and Projection Displays X
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5289
Pub. Year:
2004
Page(from):
94
Page(to):
101
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451927 [0819451924]
Language:
English
Call no.:
P63600/5289
Type:
Conference Proceedings

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