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Algorithm for identification based on spectral diagnostic feature matching technology

Author(s):
  • Chen, Z. ( Institute of Remote Sensing Applications, CAS (China) )
  • Geng, X. ( Institute of Remote Sensing Applications, CAS (China) )
  • Zhang, B. ( Institute of Remote Sensing Applications, CAS (China) )
  • Tong, Q. ( Institute of Remote Sensing Applications, CAS (China) )
  • Zheng, L. ( Institute of Remote Sensing Applications, CAS (China) )
Publication title:
Third International Symposium on Multispectral Image Processing and Pattern Recognition
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5286
Pub. Year:
2003
Page(from):
688
Page(to):
691
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451811 [0819451819]
Language:
English
Call no.:
P63600/5286.2
Type:
Conference Proceedings

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