Accelerating tomorrow's opto-electronic technologies: a comprehensive introduction to advanced optoelectronic materials and devices in the National Hi-Tech R&D Plan (863-Plan)
- Author(s):
Jiang, S. ( Wuhan Research Institute of Posts and Telecommunications (China) ) Chen, H. ( Tsinghua Univ. (China) ) Ren, X. ( Beijing Univ. of Posts and Telecommunications (China) ) Wang, Z. ( Southeast Univ. (China) ) Qian, L. ( Changchun Institute of Optics, Fine Mechanics and Physics (China) ) Zhang, R. ( Nanjing Univ. (China) ) Feng, S. ( Shanghai Institute of Microsystems and Information Technology (China) ) Yang, H. ( Institute of Semiconductors (China) ) Xu, N. ( Zhongshan Univ. (China) ) - Publication title:
- Materials, Active Devices, and Optical Amplifiers
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5280
- Pub. Year:
- 2004
- Page(from):
- 588
- Page(to):
- 593
- Pages:
- 6
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451750 [0819451754]
- Language:
- English
- Call no.:
- P63600/5280.2
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
Materials Research Society |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Design and synthesis of conjugated materials for efficient optoelectronic devices
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
A Critical Comparison Between MOVPE and MBE Growth of III-V Nitride Semiconductor Materials for Opto-Electronic Device Applications
MRS - Materials Research Society |
4
Technical Paper
A Comprehensive CFD Investigation of Grid Fins as Efficient Control Surface Devices
American Institute of Aeronautics and Astronautics |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
11
Conference Proceedings
Dissipative Structures in Bistable Electronic and Optoelectronic Semiconductor Devices
Plenum Press |
6
Conference Proceedings
Accelerating 32nm BEOL technology development by advanced wafer inspection methodology
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |