Test of 1.06-μm photo detector of PIN photodiode
- Author(s):
- Fu, R. ( Nanjing Univ. of Science and Technology (China) )
- Chang, B. ( Nanjing Univ. of Science and Technology (China) )
- Qian, Y. ( Nanjing Univ. of Science and Technology (China) )
- Zong, Z. ( Nanjing Univ. of Science and Technology (China) )
- Qiu, Y. ( Nanjing Univ. of Science and Technology (China) )
- Publication title:
- Materials, Active Devices, and Optical Amplifiers
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5280
- Pub. Year:
- 2004
- Page(from):
- 566
- Page(to):
- 573
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819451750 [0819451754]
- Language:
- English
- Call no.:
- P63600/5280.2
- Type:
- Conference Proceedings
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