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Test of 1.06-μm photo detector of PIN photodiode

Author(s):
  • Fu, R. ( Nanjing Univ. of Science and Technology (China) )
  • Chang, B. ( Nanjing Univ. of Science and Technology (China) )
  • Qian, Y. ( Nanjing Univ. of Science and Technology (China) )
  • Zong, Z. ( Nanjing Univ. of Science and Technology (China) )
  • Qiu, Y. ( Nanjing Univ. of Science and Technology (China) )
Publication title:
Materials, Active Devices, and Optical Amplifiers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5280
Pub. date:
2004
Page(from):
566
Page(to):
573
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451750 [0819451754]
Language:
English
Call no.:
P63600/5280.2
Type:
Conference Proceedings

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