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Characterization of the self-assembled InP structure grown on the GaInP epitaxial layer mismatched to GaAs substrate by near-field scanning optical microscopy (NSOM)

Author(s):
Wang, H. ( South China Normal Univ. (China) )
Liao, C. ( South China Normal Univ. (China) )
Fan, G. ( South China Normal Univ. (China) )
Liu, S.-H. ( South China Normal Univ. (China) )
Wu, Y. ( Jinan Univ. (China) )
Wang, B. ( Jinan Univ. (China) )
Zeng, G. ( Jinan Univ. (China) )
Cai, J. ( Jinan Univ. (China) )
3 more
Publication title:
Photonics: Design, Technology, and Packaging
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5277
Pub. date:
2004
Page(from):
383
Page(to):
396
Pages:
14
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451705 [0819451703]
Language:
English
Call no.:
P63600/5277
Type:
Conference Proceedings

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