Blank Cover Image

Chemical structure of low-temperature plasma-deposited silicon nitride thin films

Author(s):
Publication title:
Device and process technologies for MEMS, microelectronics, and photonics III : 10-12 December 2003, Perth, Australia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5276
Pub. Year:
2004
Page(from):
434
Page(to):
441
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819451699 [081945169X]
Language:
English
Call no.:
P63600/5276
Type:
Conference Proceedings

Similar Items:

Martyniuk, M.P., Antoszewski, J., Musca, C.A., Dell, J.M., Faraone, L.

SPIE - The International Society of Optical Engineering

Antoszewski, J., Dell, J.M., Shivalimar, T., Martyniuk, M., Winchester, K., Wehner, J., Musca, C.A., Faraone, L.

SPIE-The International Society for Optical Engineering

Musca, C.A., Nguyen, T., Antoszewski, J., Redfern, D.A., Dell, J.M., Faraone, L.

SPIE-The International Society for Optical Engineering

Karp, L., Musca, C.A., Dell, J.M., Faraone, L.

SPIE - The International Society of Optical Engineering

Martyniuk, M., Antoszewski, J., Walmsley, B. A., Musca, C. A., Dell, J. M., Jung, Y. -G., Lawn, B. R., Huang, H., …

SPIE - The International Society of Optical Engineering

Dell,J.M., Antoszewski,J., White,J.K., Pal,R., Nguyen,T., Musca,C.A., Faraone,L.

SPIE-The International Society for Optical Engineering

Nguyen, T.T., Dell, J.M., Musca, C.A., Antoszewski, J., Faraone, L.

SPIE-The International Society for Optical Engineering

Sewell, R., Dell, J.M., Musca, C.A., Faraone, L.

SPIE-The International Society for Optical Engineering

Dell, J.M., Nguyen, T., Musca, C.A., Antoszewski, J., Faraone, L., Pal, R.

Materials Research Society

Musca,C.A., Redfern,D.A., Dell,J.M., Faraone,L.

SPIE - The International Society for Optical Engineering

Nguyen, T.H., Musca, C.A., Dell, J.M., Antoszewski, J., Faraone, L.

SPIE - The International Society of Optical Engineering

Sewell, R.H., Dell, J.M., Musca, C.A., Faraone, L.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12